Optical Properties of Bismuth-Based Topological Insulators - Paola Di Pietro

Optical Properties of Bismuth-Based Topological Insulators

(Autor)

Buch | Softcover
X, 119 Seiten
2016 | 1. Softcover reprint of the original 1st ed. 2014
Springer International Publishing (Verlag)
978-3-319-35044-8 (ISBN)
106,99 inkl. MwSt
This book examines the low energy optical conductivity of TIs to distinguish the extrinsic charge contribution of the bulk from the intrinsic contribution of the surface state carriers. Describes apparatus, methods, sample preparation and analysis procedures.
Topological Insulators (TIs) are insulators in the bulk, but have exotic metallic states at their surfaces. The topology, associated with the electronic wavefunctions of these systems, changes when passing from the bulk to the surface. This work studies, by means of infrared spectroscopy, the low energy optical conductivity of Bismuth based TIs in order to identify the extrinsic charge contribution of the bulk and to separate it from the intrinsic contribution of the surface state carriers. The extensive results presented in this thesis definitely shows the 2D character of the carriers in Bismuth-based topological insulators. The experimental apparatus and the FTIR technique, the theory of optical properties and Surface Plasmon Polaritons, as well as sample preparation of both crystals and thin films, and the analysis procedures are thoroughly described.

Dr. Paola Di Pietro received both her three-year (2006) and her Master (2009, with highest marks) degrees in Physics from "Sapienza" University of Rome. She has five journal publications to her name, one of which in Nature Nanotechnology, with another article soon to come. She is currently affiliated to INSTM UdR Trieste-ST Area Science Park, Trieste, Italy. Her PhD thesis was nominated as the best in Materials Science.

List of Abbreviations.- Supervisor's Foreword.- 1 Introduction to the Topological Insulators and State of the Art.- 2 Experimental Technique, Sample Fabrication and Models for Data Analysis.- 3 Results and Analysis.

Erscheinungsdatum
Reihe/Serie Springer Theses
Zusatzinfo X, 119 p. 78 illus., 36 illus. in color.
Verlagsort Cham
Sprache englisch
Maße 155 x 235 mm
Themenwelt Naturwissenschaften Physik / Astronomie Atom- / Kern- / Molekularphysik
Technik Elektrotechnik / Energietechnik
Schlagworte ARPES Angle Resolved Photoemission Spectroscopy • Characterization and Evaluation of Materials • CSR Coherent Synchrotron Radiation • Electronic devices and materials • FTIR spectroscopy • Materials Science • optical and electronic materials • Optical Conductivity • Physics and Astronomy • plasmon resonance • Quantum Hall Effect • RHEED Reflection High-energy Electron Diffraction • semiconductors • Solid state physics • Spectrum analysis, spectrochemistry, mass spectrom • Spin-orbit Coupling • Surface chemistry and adsorption • Surface plasmon polaritons • Surfaces and Interfaces, Thin Films • TDTS Time Domain Terahertz Spectroscopy • Testing of materials • Time Reversal Symmetry • Topological Electrodynamics • Two Dimensional Electron Gas 2DEG
ISBN-10 3-319-35044-7 / 3319350447
ISBN-13 978-3-319-35044-8 / 9783319350448
Zustand Neuware
Haben Sie eine Frage zum Produkt?
Mehr entdecken
aus dem Bereich
Grundlagen und Anwendungen

von Reinhold Kleiner; Werner Buckel

Buch | Softcover (2024)
Wiley-VCH (Verlag)
79,90