Recent Advances in Analytical Spectroscopy -

Recent Advances in Analytical Spectroscopy (eBook)

Proceedings of the 9th International Conference on Atomic Spectroscopy and 22nd Colloquium Spectroscopicum Internationale, Tokyo, Japan, 4-8 September 1981

Keiichiro Fuwa (Herausgeber)

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2016 | 1. Auflage
336 Seiten
Elsevier Science (Verlag)
978-1-4832-8022-6 (ISBN)
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Recent Advances in Analytical Spectroscopy covers the joint meeting of the Ninth International Conference on Atomic Spectroscopy and the 22nd Colloquium Spectroscopicum Internationale, held at the New Otani Hotel and Sophia University, Tokyo, Japan, on September4-8, 1981. The joint meeting features 446 including 74 invited lectures and 39 poster sessions. This book is divided into 26 chapters, which reflect the analytical spectroscopic topics covered in 20 sessions, including plasma emission spectrometry, DC arc, spark and other emission spectrometry, and hydride generation technique for atomic spectrometry. Other chapters deal with furnace atomic absorption spectrometry, Zeeman atomic absorption spectrometry, atomic spectrometric detection systems for separation analysis, atomic fluorescence and scattering spectroscopy, flame atomic absorption spectrometry, spectroscopy for chemical state analysis, spectroscopy for surface and interface analysis. The remaining chapters discuss the application of computers in analytical spectroscopy, developments in laser spectroscopy, application to life science, environmental and geochemical applications, X-ray analysis, UV-VIS spectroscopy, IR and Raman spectroscopy, magnetic resonance spectroscopy, mass spectrometry, and photoacoustic spectrometry. This book will be of value to analytical chemists and related scientists and researchers.
Recent Advances in Analytical Spectroscopy covers the joint meeting of the Ninth International Conference on Atomic Spectroscopy and the 22nd Colloquium Spectroscopicum Internationale, held at the New Otani Hotel and Sophia University, Tokyo, Japan, on September4-8, 1981. The joint meeting features 446 including 74 invited lectures and 39 poster sessions. This book is divided into 26 chapters, which reflect the analytical spectroscopic topics covered in 20 sessions, including plasma emission spectrometry, DC arc, spark and other emission spectrometry, and hydride generation technique for atomic spectrometry. Other chapters deal with furnace atomic absorption spectrometry, Zeeman atomic absorption spectrometry, atomic spectrometric detection systems for separation analysis, atomic fluorescence and scattering spectroscopy, flame atomic absorption spectrometry, spectroscopy for chemical state analysis, spectroscopy for surface and interface analysis. The remaining chapters discuss the application of computers in analytical spectroscopy, developments in laser spectroscopy, application to life science, environmental and geochemical applications, X-ray analysis, UV-VIS spectroscopy, IR and Raman spectroscopy, magnetic resonance spectroscopy, mass spectrometry, and photoacoustic spectrometry. This book will be of value to analytical chemists and related scientists and researchers.

Front Cover 1
Recent Advances in Analytical Spectroscopy 4
Copyright Page 5
Table of Contents 6
Organizing Committee 8
Preface 10
CHAPTER 1. ANALYTICAL SPECTROSCOPY WITH INDUCTIVELY COUPLED PLASMAS PRESENT STATUS AND FUTURE PROSPECTS 12
INTRODUCTION 12
PHYSICAL AND SPECTROSCOPIC PROPERTIES OF ICPs 13
INDUCTIVELY COUPLED PLASMA–ATOMIC EMISSION SPECTROSCOPY (ICP–AES): PRESENT STATUS AND CAPABILITIES 14
PROBLEM AREAS IN ICP–AES 17
INDUCTIVELY COUPLED PLASMA-ATOMIC FLUORESCENCE SPECTROSCOPY (ICP–AFS) 20
INDUCTIVELY COUPLED PLASMA–MASS SPECTROSCOPY (ICP–MS) 21
ISOTOPIC ANALYSIS VIA ICP–AES 22
ICP DETECTORS FOR GAS AND LIQUID CHROMATOGRAPHY 23
THE FUTURE 23
REFERENCES 24
CHAPTER 2. SOME PERSPECTIVES IN ANALYTICAL SPECTROMETRY 26
Conventional Spectroscopy 26
X-Ray Imaging 27
Multi-wire Proportional Chambers (MWPC) 29
Gamma Ray Imaging – Transverse Section Emission Tomography 30
The use of coded apertures with digital decoding 30
3-Dimensional Ultrasonic Imaging 31
Scanning Acoustic Microscopy 32
Imaging by nuclear magnetic resonance 33
Thermographic Imaging 33
Scanning Photoacoustic Microscopy 34
References 36
CHAPTER 3. COMBINED XRD–XRF IMPROVE MATERIALS CHARACTERIZATION 38
INTRODUCTION 38
BASIS FOR COMBINING XRF and XRD 38
HISTORICAL DEVELOPMENT OF XRF AND XRD 39
QUANTITATIVE XRD FOR COMPOUND ANALYSIS 39
PRESENT SEARCH–MATCH METHODS FUR QUALITATIVE XRD 40
SPECULATION ON NEW APPROACHES 41
SUMMARY 41
REFERENCES 42
CHAPTER 4. AUTOMATED ATOMIC SPECTROMETRIC ANALYSIS 44
INTRODUCTION 44
SAMPLE PRESENTATION 45
INSTRUMENT ADJUSTMENT 46
DATA TREATMENT 53
CONCLUSION 58
ACKNOWLEDGEMENT 59
REFERENCES 59
CHAPTER 5. SPATIAL DISTRIBUTION OF ANALYTE SPECIES IN THE INDUCTIVELY COUPLED PLASMA 62
INTRODUCTION 62
EXPERIMENTAL 62
RESULTS AND DISCUSSION 64
CONCLUSIONS 71
REFERENCES 71
CHAPTER 6. SELECTION AND DETECTION OF ICP RADIATION 72
INTRODUCTION 72
OPTIMIZATION OF ICP PARAMETERS 72
PROMINENT LINES 75
LINE COINCIDENCE TABLES AND SOFTWARE 76
NOISE IN ICP SPECTROMETRY 77
EXCITATION MECHANISM IN ARGON ICPs 81
CONCLUSIONS 83
REFERENCES 84
CHAPTER 7. ROLE OF PLASMA GAS IN EMISSION SPECTROSCOPY 86
INTRODUCTION 86
INDUCTIVELY–COUPLED ARGON PLASMA 86
INDUCTIVELY–COUPLED NITROGEN OR ARGON-NITROGEN PLASMAS 89
QUEST OF AN UNIVERSAL PLASMA GAS : HELIUM ? 89
DISCUSSION 92
REFERENCES 93
CHAPTER 8. SAMPLE INTRODUCTION STUDIES USING A THREE-ELECTRODE DIRECT CURRENT PLASMA 94
INTRODUCTION 94
OPTICAL CONSIDERATIONS 97
DISCRETE SAMPLE INTRODUCTION INTO THE DCP 99
ORGANIC SOLVENT INTRODUCTION INTO THE DCP 100
ACKNOWLEDGEMENT 101
REFERENCES 102
CHAPTER 9. ENERGIES OF RATE LIMITING ATOMIZATION PROCESSES IN ETA THEIR MEASUREMENT AND SIGNIFICANCE 104
INTRODUCTION 104
METHODS POR ASSESSMENT OP ATOMIZATION MECHANISMS 104
THE RATE LIMITING ATOMIZATION ENERGIES 108
CONCLUSIONS 112
REFERENCES 113
CHAPTER 10. A NEW ANALYTICAL TECHNIQUE – CAPACITIVE DISCHARGE GRAPHITE FURNACE ATOMIC ABSORPTION SPECTROMETRY 114
INTRODUCTION 114
CAPACITIVE DISCHARGE TECHNIQUE 114
EXPERIMENTAL 115
RESULTS AND DISCUSSION 116
CONCLUSIONS 127
REFERENCES 128
CHAPTER 11. RECENT STUDIES OF ABSORPTION SPECTRA OF SOME ATOMIC AND DIATOMIC SPECIES 130
INTRODUCTION 130
EXPERIMENTAL 130
RESULTS AND DISCUSSIONS 131
LITERATURES 140
CHAPTER 12. EXTENDING THE FRONTIERS OF ANALYTICAL ATOMIC SPECTROMETRY – INTERFACES WITH OTHER ANALYTICAL EQUIPMENT 142
INTERFACE OF PLASMA WITH A MASS SPECTROMETER 142
FURNACES (USED AS VOLATILIÆERS) INTERFACED WITH TECHNIQUES OF ATOMIC SPECTROMETRY 144
ATOMIC SPECTROMETRY ELEMENT SPECIFIC DETECTORS FOR CHROMATOGRAPHY 146
APPLICATIONS 149
OPINIONATED CONCLUSIONS 159
REFERENCES 159
CHAPTER 13. ATOMIC FLUORESCENCE SPECTROMETRY. PAST, PRESENT, AND FUTURE 162
INTRODUCTION 162
WHY USE ATOMIC FLUORESCENCE SPECTROMETRY? 163
THE PAST/THE PRESENT 163
THE PRESENT/THE FUTURE 171
REFERENCES 175
CHAPTER 14. ATOMIC SPECTROSCOPY WITH SYNCHROTRON RADIATION 176
PROPERTIES OF SYNCHROTRON RADIATION 176
CHAPTER 15. RONTGEN-UND PHOTOELEKTRONENSPEKTROSKOPISCHE UNTERSUCHNUNGEN VON CHEMISHEN VERBINDUNGEN 186
EINLEITUNG 186
EXPERIMENTELLES 188
ERGEBNISSE UND DISKUSSION 188
LITERATUR 194
CHAPTER 16. ANALYTICAL SCANNING ELECTRON MICROSCOPY IN UHV FOR SOLID SURFACE 196
INTRODUCTION 196
EXPERIMENTAL APPARATUS 196
MEASUREMENTS OF SURFACE SENSITIVITY FOR ABSORPTION ELECTRON IMAGE AS A FUNCTION OF Ep 198
DYNAMIC OBSERVATIONS OF SURFACE STATE BY UHV-SEM 203
SECONDARY ELECTRON AND ENERGY LOSS ELECTRON SPECTROSCOPIES FOR SURFACE ANALYSIS 206
DISCUSSIONS 209
CONCLUSION 210
REFERENCES 210
CHAPTER 17. NEW TECHNIQUES OF EXTENDED ELECTRON SPECTROSCOPY AND RELATED SPECTROSCOPIES 212
INTRODUCTION 212
INELASTIC ELECTRON TUNNELING SPECTROSCOPY 212
IN-HOUSE EXTENDED X-RAY ABSORPTION FINE STRUCTURE SPECTROMETRY 214
SOLUTION PHOTOEMISSION SPECTROSCOPY 219
REFERENCES 221
CHAPTER 18. THE STUDY OF THE STRUCTURE OF ADSORBED MOLECULES ON SOLID SURFACES BY HIGH RESOLUTION ELECTRON ENERGY LOSS SPECTROSCOPY AND LOW ENERGY ELECTRON DIFFRACTION 222
INTRODUCTION 222
INSTRUMENTATION 223
HIGH RESOLUTION ELECTRON ENERGY LOSS SPECTROSCOPY (HREELS) 229
IMPROVEMENTS AND DIRECTIONS IN HREELS FOR THE NEAR FUTURE 240
REFERENCES 240
ACKNOWLEDGEMENT 243
CHAPTER 19. RADIO FREQUENCY PLASMA INTRODUCTION OF SURFACE FUNCTIONALITIES ONTO CARBON AND SURFACE CHARACTERIZATION BY X-RAY PHOTOELECTRON SPECTROSCOPY 244
SURVEY OF PLASMA RESULTS 245
OXYGEN FUNCTIONAL GROUP SPECIATION 246
SAMPLE HANDLING AND INTRODUCTION SYSTEM 251
SUMMARY 257
ACKNOWLEDGEMENT 257
LITERATURE CITED 257
CHAPTER 20. THE SPUTTERED ATOM LIGHT SOURCE 260
1. INTRODUCTION 260
2. PROPERTIES OF THE SPUTTERED ATOM LIGHT SOURCE 261
3. POSSIBLE APPLICATION OF THE SPUTTERED ATOM LIGHT SOURCE TO SPECTROSCOPIC STUDIES 266
4. ANALYSIS OF SOLIDS WITH THE SPUTTERED ATOM LIGHT SOURCE 267
5. CONCLUSIONS 270
ACKNOWLEDGEMENT 271
REFERENCES 271
CHAPTER 21. DISTRIBUTED FUNCTION PROCESSOR SYSTEMS FOR SPECTROSCOPY LABORATORY 274
INTRODUCTION 274
A SPECTROPHOTOMETRIC SYSTEM FOR SIMULTANEOUS FLUORESCENCE-AND-ABSORPTION MEASUREMENT SUPPORTED BY HIERARCHICAL COMPUTER ORGANIZATION 274
A BUILDING-BLOCK SMALL SPECTROPHOTOMETER SYSTEM COMPOSED OF MICROPROCESSOR INTEGRATED MODULES 277
A SMALL LABORATORY-AUTOMATION SYSTEM ORGANIZED BY MICROCOMPUTER-BASED ANALYTICAL INSTRUMENTS 281
SUMMARY 283
REFERENCES 283
CHAPTER 22. THE SPECTROSCOPIST AND THE COMPUTER– A PARTNERSHIP 286
INTRODUCTION 286
INTERFACES 287
ATTITUDES 287
DATA STATION 288
CDS FUNCTION KEYS 288
PROGRAM SIZE 289
ALGORITHMS 290
SEARCH 291
ERRORS 292
'SPECTRUM OUT OF RANGE', 'INCORRECT ARGUMENT', 'REGION NOT X, Y OR Z' 293
OBEY FILES 293
SYSTEM DEVELOPMENT 294
SUMMARY 295
CHAPTER 23. FLOW INJECTION METHOD– A NEW TOOL FOR INSTRUMENTAL ANALYSIS 296
Principles and Present Status 296
Future Trends 297
References 300
Acknowledgement 300
CHAPTER 24. TIME RESOLVED SPECTROSCOPY OF STRETCHED POLYPROPYLENE FILMS 302
INTRODUCTION 302
BACKGROUND 302
EXPERIMENTAL 304
RESULTS 305
REFERENCES 305
CHAPTER 25. ANALYTICAL APPLICATIONS OF DIFFUSE REFLECTANCE INFRARED FOURIER TRANSFORM SPECTROSCOPY 310
OPTICAL CONFIGURATIONS 310
QUANTITATIVE ASPECTS 311
MICROSAMPLING AND THE HPLC/FT-IR INTERFACE 313
SURFACE SPECTROMETRY 314
SUMMARY 319
REFERENCES 320
CHAPTER 26. NEW DEVELOPMENTS IN PHOTOACOUSTICS 322
I. INTRODUCTION 322
II. PHOTOACOUSTIC FOURIER-TRANSFORM SPECTROSCOPY 322
III. SPIN-RESONANCE SPECTROSCOPY 323
IV. PHASE TRANSITIONS 325
V. THERMAL–WAVE IMAGING AND MICROSCOPY 326
VI. CONCLUSIONS 330
REFERENCES 330
REFERENCES (Continued) 331

Erscheint lt. Verlag 29.7.2016
Sprache englisch
Themenwelt Naturwissenschaften Chemie Analytische Chemie
Naturwissenschaften Physik / Astronomie Elektrodynamik
Technik
ISBN-10 1-4832-8022-5 / 1483280225
ISBN-13 978-1-4832-8022-6 / 9781483280226
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