Ion Implantation and Synthesis of Materials - Michael Nastasi, James W. Mayer

Ion Implantation and Synthesis of Materials

Buch | Softcover
XIV, 263 Seiten
2010 | 1. Softcover reprint of hardcover 1st ed. 2006
Springer Berlin (Verlag)
978-3-642-06259-9 (ISBN)
106,99 inkl. MwSt
Ion implantation is one of the key processing steps in silicon integrated circuit technology. Some integrated circuits require up to 17 implantation steps and circuits are seldom processed with less than 10 implantation steps. Controlled doping at controlled depths is an essential feature of implantation. Ion beam processing can also be used to improve corrosion resistance, to harden surfaces, to reduce wear and, in general, to improve materials properties. This book presents the physics and materials science of ion implantation and ion beam modification of materials. It covers ion-solid interactions used to predict ion ranges, ion straggling and lattice disorder. Also treated are shallow-junction formation and slicing silicon with hydrogen ion beams. Topics important for materials modification, such as ion-beam mixing, stresses, and sputtering, are also described.

General Features and Fundamental Concepts.- Particle Interactions.- Dynamics of Binary Elastic Collisions.- Cross-Section.- Ion Stopping.- Ion Range and Range Distribution.- Displacements and Radiation Damage.- Channeling.- Doping, Diffusion and Defects in Ion-Implanted Si.- Crystallization and Regrowth of Amorphous Si.- Si Slicing and Layer Transfer: Ion-Cut.- Surface Erosion During Implantation: Sputtering.- Ion-Induced Atomic Intermixing at the Interface: Ion Beam Mixing.- Application of Ion Implantation Techniques in CMOS Fabrication.- Ion implantation in CMOS Technology: Machine Challenges.

Erscheint lt. Verlag 12.2.2010
Zusatzinfo XIV, 263 p. 131 illus.
Verlagsort Berlin
Sprache englisch
Maße 155 x 235 mm
Gewicht 428 g
Themenwelt Naturwissenschaften Physik / Astronomie Atom- / Kern- / Molekularphysik
Naturwissenschaften Physik / Astronomie Hochenergiephysik / Teilchenphysik
Schlagworte Crystal • Diffusion • Distribution • Doping • Implanted shallow junctions • ion implantation • Ion-modified materials • Ion ranges • Materials properties • Materials Science • Slicing silicon
ISBN-10 3-642-06259-8 / 3642062598
ISBN-13 978-3-642-06259-9 / 9783642062599
Zustand Neuware
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