Electron Energy-loss Spectroscopy in the Electron Microscope

R. F. Egerton (Autor)

Buch | Hardcover

500 Seiten

1996 | 2nd Revised edition
Plenum Publishing Co.,N.Y. (Verlag)
978-0-306-45223-9 (ISBN)

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Explores several applications of EELS developed over the years. This work includes chapters that explore progress in parallel-recording detectors and image-filtering systems as well as spectral fine structure. It also features computer programs which can perform spectrum deconvolution and compute partial ionization cross-sections.

The Second Edition explores several new applications of EELS developed during the last ten years. The chapters include recent progress in parallel-recording detectors and image-filtering systems as well as spectral fine structure. This edition also features updated computer programs which will perform spectrum deconvolution and compute partial ionization cross-sections.

An Introduction to Electron Energyloss Spectroscopy. Instrumentation for Energyloss Spectroscopy. Electron Scattering Theory. Quantitative Analysis of the Energyloss Spectrum. Applications of Electron Energyloss Spectroscopy. Appendix A: Relativistic Bethe Theory. Appendix B: Computer Programs. Appendix C: Plasmon Energies of Some Elements and Compounds. Appendix D: Innershell Energies and Edge Shapes. Appendix E: Electron Wavelengths and Relativistic Factor: Fundamental Constants. Index.

Zusatzinfo	Illustrations
Verlagsort	New York
Sprache	englisch
Maße	155 x 235 mm
Gewicht	1930 g
Themenwelt	Naturwissenschaften ► Biologie ► Allgemeines / Lexika
ISBN-10	0-306-45223-5 / 0306452235
ISBN-13	978-0-306-45223-9 / 9780306452239
Zustand	Neuware