Mixed-Signal Generic Testing in Photonic Integration
Springer International Publishing (Verlag)
978-3-031-60810-0 (ISBN)
This book describes testing methods for Novel Photonic Integrated Circuits, which have become one of the hottest topics in the context of information technology. Readers will learn that these objects are used not only to enhance the throughput of optical communications (backbone of the internet network), but also to for smart-sensing, metrology, quantum application and artificial intelligence. The increasing demand for this kind of device drives the need for fast and effective testing methods, as described in this book.
Matteo Petrini (1995) received the B.Sc in Computer Science and Engineering (summa cum laude) in 2017 the M.Sc in Telecommunication Engineering (summa cum laude) in 2019, and the Ph.D. in Information Technology (summa cum laude) in 2023, always at Politecnico di Milano. During the Ph.D., he was focusing on techniques for automatic tuning and testing of Photonic Integrated Circuits.
He is now with Cisco Photonics Italy, as HW engineer, handling the NPI (New Projects Introduction) of new Optical Line Cards, from their design to the after-sell troubleshooting.
Introduction.- Towards Testing in Integrated Photonics.- The Device Under Test.- Electrical Testing.- Techniques and Methods for Optical Testing.- Mitigation of Nonlinear Effects.- Conclusion.
| Erscheinungsdatum | 03.08.2024 |
|---|---|
| Reihe/Serie | Synthesis Lectures on Digital Circuits & Systems |
| Zusatzinfo | XXXIII, 148 p. 92 illus., 88 illus. in color. |
| Verlagsort | Cham |
| Sprache | englisch |
| Maße | 168 x 240 mm |
| Themenwelt | Informatik ► Weitere Themen ► Hardware |
| Technik ► Elektrotechnik / Energietechnik | |
| Schlagworte | Electrical Testing • Optical Testing • Photonic testing • Testing in Integrated Photonics • Testing of Optical Delay Lines |
| ISBN-10 | 3-031-60810-0 / 3031608100 |
| ISBN-13 | 978-3-031-60810-0 / 9783031608100 |
| Zustand | Neuware |
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