Robust Regression and Outlier Detection
Seiten
1987
John Wiley & Sons Inc (Verlag)
978-0-471-85233-9 (ISBN)
John Wiley & Sons Inc (Verlag)
978-0-471-85233-9 (ISBN)
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Provided here is an applications-oriented introduction to robust regression and outlier detection, emphasising 'high- breakdown' methods which can cope with a sizeable fraction of contamination.
Provides an applications-oriented introduction to robust regression and outlier detection, emphasising -high-breakdown- methods which can cope with a sizeable fraction of contamination. Its self-contained treatment allows readers to skip the mathematical material which is concentrated in a few sections. Exposition focuses on the least median of squares technique, which is intuitive and easy to use, and many real-data examples are given. Chapter coverage includes robust multiple regression, the special case of one-dimensional location, algorithms, outlier diagnostics, and robustness in related fields, such as the estimation of multivariate location and covariance matrices, and time series analysis.
Provides an applications-oriented introduction to robust regression and outlier detection, emphasising -high-breakdown- methods which can cope with a sizeable fraction of contamination. Its self-contained treatment allows readers to skip the mathematical material which is concentrated in a few sections. Exposition focuses on the least median of squares technique, which is intuitive and easy to use, and many real-data examples are given. Chapter coverage includes robust multiple regression, the special case of one-dimensional location, algorithms, outlier diagnostics, and robustness in related fields, such as the estimation of multivariate location and covariance matrices, and time series analysis.
Simple Regression. Multiple Regression. The Special Case of One--Dimensional Location. Algorithms. Outlier Diagnostics. Related Statistical Techniques. References. Index.
Erscheint lt. Verlag | 2.12.1987 |
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Reihe/Serie | Wiley Series in Probability & Mathematical Statistics: Applied Probability & Statistics |
Zusatzinfo | Ill. |
Verlagsort | New York |
Sprache | englisch |
Maße | 159 x 236 mm |
Gewicht | 567 g |
Themenwelt | Mathematik / Informatik ► Mathematik ► Angewandte Mathematik |
ISBN-10 | 0-471-85233-3 / 0471852333 |
ISBN-13 | 978-0-471-85233-9 / 9780471852339 |
Zustand | Neuware |
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