DNA Damage Recognition -

DNA Damage Recognition

Buch | Softcover
896 Seiten
2019
CRC Press (Verlag)
978-0-367-39213-0 (ISBN)
77,30 inkl. MwSt
Stands as the most comprehensive guide to the subject—covering every essential topic related to DNA damage identification and repair.

Covering a wide array of topics from bacteria to human cells, this book summarizes recent developments in DNA damage repair and recognition while providing timely reviews on the molecular mechanisms employed by cells to distinguish between damaged and undamaged sites and stimulate the appropriate repair pathways.

about the editors...

WOLFRAM SIEDE is Associate Professor, Department of Cell Biology and Genetics, University of North Texas Health Science Center, Fort Worth. He received the Ph.D. degree (1986) from Johann Wolfgang Goethe University, Frankfurt Germany.

YOKE WAH KOW is Professor, Department of Radiation Oncology, Emory University School of Medicine, Atlanta, Georgia. He received the Ph.D. degree (1981) from Brandeis University, Waltham, Massachusetts.

PAUL W. DOETSCH is Professor, Departments of Biochemistry, Radiation Oncology, and Hematology and Oncology, and Associate Director for Basic Research, Winship Cancer Institute, Emory University School of Medicine, Atlanta, Georgia. He received the Ph.D. degree (1982) from Temple University School of Medicine, Philadelphia, Pennsylvania.

Wolfram Siede, Yoke Wah Kow, Paul W. Doetsch

Mechanisms of Damage Recognition: Theoretical Considerations. UV Damage and Other Bulky DNA-adducts. Non-bulky Base Damage. Mismatch Repair. Replicational Bypass of DNA Lesions. DNA Strand Breaks. Perception of DNA Damage for Initiating Regulatory Responses

Erscheinungsdatum
Verlagsort London
Sprache englisch
Maße 178 x 254 mm
Gewicht 1655 g
Themenwelt Informatik Weitere Themen Bioinformatik
Naturwissenschaften Biologie Biochemie
Naturwissenschaften Biologie Genetik / Molekularbiologie
ISBN-10 0-367-39213-5 / 0367392135
ISBN-13 978-0-367-39213-0 / 9780367392130
Zustand Neuware
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