Computer Vision for X-Ray Testing
Imaging, Systems, Image Databases, and Algorithms
Seiten
2015
|
1st ed. 2015
Springer International Publishing (Verlag)
978-3-319-20746-9 (ISBN)
Springer International Publishing (Verlag)
978-3-319-20746-9 (ISBN)
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This accessible textbook presents an introduction to computer vision algorithms for industrially-relevant applications of X-ray testing. Features: introduces the mathematical background for monocular and multiple view geometry; describes the main techniques for image processing used in X-ray testing; presents a range of different representations for X-ray images, explaining how these enable new features to be extracted from the original image; examines a range of known X-ray image classifiers and classification strategies; discusses some basic concepts for the simulation of X-ray images and presents simple geometric and imaging models that can be used in the simulation; reviews a variety of applications for X-ray testing, from industrial inspection and baggage screening to the quality control of natural products; provides supporting material at an associated website, including a database of X-ray images and a Matlab toolbox for use with the book's many examples.
Dr. Domingo Mery is a Full Professor at the Machine Intelligence Group (GRIMA) of the Department of Computer Sciences, and Director of Research and Innovation at the School of Engineering, at the Pontificia Universidad Católica de Chile, Santiago, Chile.
X-ray Testing
Images for X-ray Testing
Geometry in X-ray Testing
X-ray Image Processing
X-ray Image Representation
Classification in X-ray Testing
Simulation in X-ray Testing
Applications in X-ray Testing
Appendix A: GDXray Details
Appendix B: XVIS Toolbox - Quick Reference
Erscheint lt. Verlag | 4.8.2015 |
---|---|
Zusatzinfo | XXIV, 347 p. 311 illus., 62 illus. in color. |
Verlagsort | Cham |
Sprache | englisch |
Maße | 155 x 235 mm |
Themenwelt | Informatik ► Grafik / Design ► Digitale Bildverarbeitung |
Schlagworte | algorithms • computer vision • Image Analysis • Image Processing • MATLAB • non-destructive testing • pattern recognition • X-Ray Testing |
ISBN-10 | 3-319-20746-6 / 3319207466 |
ISBN-13 | 978-3-319-20746-9 / 9783319207469 |
Zustand | Neuware |
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