The Synthesis Approach to Digital System Design
Springer-Verlag New York Inc.
978-1-4613-6615-7 (ISBN)
Foreword.- Acknowledgements.- 1 Introduction to Synthesis.- 1.1 The Y-Chart—Levels and Domains of Description.- 1.2 Design Flow and Taxonomy of Synthesis.- 1.3 Entry Points and User Interfaces.- 1.4 Validation.- 1.5 Testing.- 2 Hardware Description Languages and their Relevance to Synthesis.- 2.1 Introduction.- 2.2 VHDL Example- Bar-Code Preprocessor.- 2.3 VHDL Hardware Description Language.- 2.4 Relevance of HDLs to Synthesis.- 2.5 Outlook.- 2.6 Problems for the Reader.- 3 Logic-Level Synthesis.- 3.1 Introduction.- 3.2 Preliminaries and Definitions.- 3.3 Minimization of Two-Level Logic.- 3.4 Optimization of Multi-Level Logic.- 3.5 Outlook.- 3.6 Problems for the Reader.- 4 Technology Mapping.- 4.1 Introduction.- 4.2 Abstraction of Technology.- 4.3 Logic-Level Technology Mapping.- 4.4 Register-Transfer Level Technology Mapping.- 4.5 Outlook.- 4.6 Problems for the Reader.- 5 Register-Transfer Level Synthesis.- 5.1 Introduction.- 5.2 Data Path Synthesis.- 5.3 Controller Synthesis.- 5.4 Outlook.- 5.5 Problems for the Reader.- 6 High-Level Synthesis.- 6.1 Introduction.- 6.2 Internal Representation.- 6.3 Synthesis of the Register-Transfer Level Structure.- 6.4 Scheduling.- 6.5 Allocation and Assignment Tasks.- 6.6 Outlook.- 6.7 Problems for the Reader.- 7 System-Level Synthesis.- 7.1 Introduction.- 7.2 System-Level Partitioning.- 7.3 Behavioral Transformations.- 7.4 Synthesizing from System-Level Descriptions.- 7.5 Outlook.- 8 Formal Methods for Synthesis.- 8.1 Introduction.- 8.2 Formal Reasoning about Digital Systems.- 8.3 Interactive, Formal Synthesis.- 8.4 Formally Verified Synthesis Functions.- 8.5 Outlook.- 8.6 Problems for the Reader.- 9 Synthesis Related Aspects of Simulation.- 9.1 Introduction.- 9.2 Multi-Level Modeling.- 9.3 Simulation Techniques.- 9.4 Multi-LevelSimulation.- 9.5 Outlook.- 9.6 Problems for the Reader.- 10 Synthesis Related Aspects in Testing.- 10.1 Introduction.- 10.2 General Testability Aspects.- 10.3 Test Objects in Synthesis.- 10.4 Test Methods for Synthesis.- 10.5 Test Data Generation.- 10.6 Outlook.- 10.7 Problems for the Reader.
Erscheint lt. Verlag | 11.10.2012 |
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Reihe/Serie | The Springer International Series in Engineering and Computer Science ; 170 |
Zusatzinfo | XV, 415 p. |
Verlagsort | New York, NY |
Sprache | englisch |
Maße | 155 x 235 mm |
Themenwelt | Informatik ► Weitere Themen ► CAD-Programme |
Technik ► Elektrotechnik / Energietechnik | |
ISBN-10 | 1-4613-6615-1 / 1461366151 |
ISBN-13 | 978-1-4613-6615-7 / 9781461366157 |
Zustand | Neuware |
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