Scanning Probe Microscopy
Springer-Verlag New York Inc.
978-0-387-28667-9 (ISBN)
SPM Techniques for Electrical Characterization.- Scanning Tunneling Potentiometry: The Power of STM applied to Electrical Transport.- Probing Semiconductor Technology and Devices with Scanning Spreading Resistance Microscopy.- Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics.- Principles of Kelvin Probe Force Microscopy.- Frequency-Dependent Transport Imaging by Scanning Probe Microscopy.- Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy.- Principles of Near-Field Microwave Microscopy.- Electromagnetic Singularities and Resonances in Near-Field Optical Probes.- Electrochemical SPM.- Near-Field High-Frequency Probing.- Electrical and Electromechanical Imaging at the Limits of Resolution.- Scanning Probe Microscopy on Low-Dimensional Electron Systems in III–V Semiconductors.- Spin-Polarized Scanning Tunneling Microscopy.- Scanning Probe Measurements of Electron Transport in Molecules.- Scanning Probe Microscopy of Individual Carbon Nanotube Quantum Devices.- Conductance AFM Measurements of Transport Through Nanotubes and Nanotube Networks.- Theory of Scanning Probe Microscopy.- Multi-Probe Scanning Tunneling Microscopy.- Dynamic Force Microscopy and Spectroscopy in Vacuum.- Scanning Tunneling Microscopy and Spectroscopy of Manganites.- Electrical SPM Characterization of Materials and Devices.- Scanning Voltage Microscopy.- Electrical Scanning Probe Microscopy of Biomolecules on Surfaces and at Interfaces.- Electromechanical Behavior in Biological Systems at the Nanoscale.- Scanning Capacitance Microscopy.- Kelvin Probe Force Microscopy of Semiconductors.- Nanoscale Characterization of Electronic and Electrical Properties of III-Nitrides by Scanning Probe Microscopy.- Electron Flow Through MolecularStructures.- Electrical Characterization of Perovskite Nanostructures by SPM.- SPM Measurements of Electric Properties of Organic Molecules.- High-Sensitivity Electric Force Microscopy of Organic Electronic Materials and Devices.- Electrical Nanofabrication.- Electrical SPM-Based Nanofabrication Techniques.- Fundamental Science and Lithographic Applications of Scanning Probe Oxidation.- UHV-STM Nanofabrication on Silicon.- Ferroelectric Lithography.- Patterned Self-Assembled Monolayers via Scanning Probe Lithography.- Resistive Probe Storage: Read/Write Mechanism.
Zusatzinfo | 16 Illustrations, color; 13 Illustrations, black and white; XL, 980 p. 365 illus., 15 illus. in color. |
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Verlagsort | New York, NY |
Sprache | englisch |
Maße | 155 x 235 mm |
Themenwelt | Technik ► Maschinenbau |
ISBN-10 | 0-387-28667-5 / 0387286675 |
ISBN-13 | 978-0-387-28667-9 / 9780387286679 |
Zustand | Neuware |
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