Statistical Analysis with Missing Data (eBook)

RODERICK J. A. LITTLE, PhD, is Professor and Chair of Biostatistics at the University of Michigan. DONALD B. RUBIN, PhD, is the Chair of the Department of Statistics at Harvard University.

Preface.

PART I: OVERVIEW AND BASIC APPROACHES.

Introduction.

Missing Data in Experiments.

Complete-Case and Available-Case Analysis, Including WeightingMethods.

Single Imputation Methods.

Estimation of Imputation Uncertainty.

PART II: LIKELIHOOD-BASED APPROACHES TO THE ANALYSIS OF MISSINGDATA.

Theory of Inference Based on the Likelihood Function.

Methods Based on Factoring the Likelihood, Ignoring theMissing-Data Mechanism.

Maximum Likelihood for General Patterns of Missing Data:Introduction and Theory with Ignorable Nonresponse.

Large-Sample Inference Based on Maximum LikelihoodEstimates.

Bayes and Multiple Imputation.

PART III: LIKELIHOOD-BASED APPROACHES TO THE ANALYSIS OF MISSINGDATA: APPLICATIONS TO SOME COMMON MODELS.

Multivariate Normal Examples, Ignoring the Missing-DataMechanism.

Models for Robust Estimation.

Models for Partially Classified Contingency Tables, Ignoring theMissing-Data Mechanism.

Mixed Normal and Nonnormal Data with Missing Values, Ignoringthe Missing-Data Mechanism.

Nonignorable Missing-Data Models.

References.

Author Index.

Subject Index.

"I enjoyed reading this well written book. I recommend it highly tostatisticians." (Journal of Statistical Computation &Simulation, July 2004)

"...a well written and well documented text formissing data analysis..." (Statistical Methods in MedicalResearch, Vol.14, No.1, 2005)

"An update to this authoritative book is indeed welcome."(Journal of the American Statistical Association, December2004)

"...this is an excellent book. It is well written andinspiring..." (Statistics in Medicine, 2004;23)

"...this second edition offers a thoroughly up-to-date,reorganized survey of of current methods for handling missing dataproblems..." (Zentralblatt Math, Vol.1011, No.11, 203)

"...well written and very readable...a comprehensive, updatetreatment of an important topic by two of the leading researchersin the field. In summary, I highly recommend this book..."(Technometrics, Vol. 45, No. 4, November 2003)