Industrial Applications of X-Ray Diffraction -

Industrial Applications of X-Ray Diffraction

Frank Smith (Herausgeber)

Buch | Hardcover
1024 Seiten
1999
Crc Press Inc (Verlag)
978-0-8247-1992-0 (ISBN)
489,95 inkl. MwSt
By illustrating a wide range of specific applications in all major industries, this work broadens the coverage of X-ray diffraction beyond basic tenets, research and academic principles. The book serves as a guide to solving problems faced everyday in the laboratory, and offers a review of the current theory and practice of X-ray diffraction, major advances and potential uses.

Frank Smith

Part 1 Introduction: the principles of diffraction analysis; the practice of diffraction analysis; progress and potential x-ray diffraction. Part 2 Industrial applications - high tech: semiconductors - integrated circuit manufacture; superconductors -structures and applications; aerospace - the aircraft gas turbine industry; automotive - selected cases of applications; petroleum exploration and production; petroleum and petrochemicals; petrochemicals - catalysts in refineries; petrochemicals -vitality of catalysts research. Part 3 Metals: hydrometallurgy; x-ray fractography. Part 4 Minerals and ceramics: mining -exploration and process control; mining - mineral ores and products; cement - quantitative phase analysis of Portland cement clinker; silica; glass-ceramics. Part 5 Polymers and composites: polymer industry; paint and pigment industry; pharmaceuticals -development and formulation; pharmaceuticals - design and development of drug delivery systems. Part 6 Chemicals: energy -by-products of coal combustion in power plants; lighting - design and development of luminescent materials; photography - image capture and image storage materials; detergents and cleansers -phase analysis of sodium phosphates; museum - art and archaeology; forensic science - every contact leaves a trace; US Customs laboratories; commercial service laboratory. Part 7 Specialty techniques - radiations: synchrotron usage by industry; electron microscopy in industry. Part 8 Microstructures and instrumentation: line profile and sample microstructure; thin films and multilayers; residual stress and stress gradients; residual stress development and texture formation during rolling contact loading; Warren-Averbach applications; microbeam crystallographic and elemental analysis; high temperature and non-ambient x-ray diffraction. Part 9 Diffraction patterns: NIST standard reference materials for characterization of instrument performance; grain orientation and texture; structure analysis from powder data.

Erscheint lt. Verlag 22.9.1999
Verlagsort Bosa Roca
Sprache englisch
Maße 178 x 254 mm
Gewicht 2120 g
Themenwelt Naturwissenschaften Physik / Astronomie Hochenergiephysik / Teilchenphysik
Technik Maschinenbau
ISBN-10 0-8247-1992-1 / 0824719921
ISBN-13 978-0-8247-1992-0 / 9780824719920
Zustand Neuware
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