Modern Techniques for Characterizing Magnetic Materials
Springer-Verlag New York Inc.
978-1-4020-8007-4 (ISBN)
Neutron Scattering.- Magnetic neutron scattering.- Small-angle neutron scattering.- Application of polarized neutron reflectometry to studies of artificially structured magnetic materials.- X-ray Scattering.- Resonant soft x-ray techniques to resolve nanoscale magnetism.- Hard x-ray resonant techniques for studies of nanomagnetism.- Spin-resolved photoemission studies of magnetic films.- Electron Scattering.- Magnetic phase imaging with transmission electron microscopy.- Spin-polarized scanning electron microscopy.- Spin-polarized low energy electron microscopy (SPLEEM).- Proximal Probe.- Spin-polarized scanning tunneling microscopy.- Magnetic force microscopy.- Light Scattering.- Scanning near-field magneto-optic microscopy.- Magnetization dynamics using time-resolved magneto-optic microscopy.- Brillouin light scattering spectroscopy.
Zusatzinfo | 53 Illustrations, color; 407 Illustrations, black and white; XX, 600 p. 460 illus., 53 illus. in color. |
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Verlagsort | New York, NY |
Sprache | englisch |
Maße | 178 x 254 mm |
Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Elektrodynamik |
Technik ► Maschinenbau | |
ISBN-10 | 1-4020-8007-7 / 1402080077 |
ISBN-13 | 978-1-4020-8007-4 / 9781402080074 |
Zustand | Neuware |
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