Modern Developments and Applications in Microbeam Analysis

Recent Developments in Instrumentation for X-Ray Microanalysis.- High Resolution Non Dispersive X-Ray Spectroscopy with State of the Art Silicon Detectors.- Efficiency Calibration of a Si(Li) Detector by EPMA.- Wavelength-Dispersive X-Ray Spectrometry.- X-Ray Spectrum Processing and Multivariate Analysis.- Thin Film Analysis and Chemical Mapping in the Analytical Electron Microscope.- On the Spatial Resolution in Analytical Electron Microscopy.- Contamination in Analytical Electron Microscopy and in ALCHEMI.- Analytical Electron Microscopy of Diffusional Interfaces in an Al-22 at. % Zn Alloy.- Quantitative TEM-EDXS of Sol-Gel Derived PZT Ceramic Materials.- Particulate Composites of TZP-Chromium Oxide and TZP-Chromium Carbide; Microbeam Investigations.- Cryo-Electron Spectroscopic Imaging, Electron Energy-Loss Spectroscopy and Energy-Dispersive X-Ray Analysis of Ag(Br, I) Nano- and Microcrystals.- Electron Energy-Loss Near-Edge Structure of Alumina Polymorphs.- SPM Study of YBCO Films Prepared by Plasma Assisted Laser Ablation.- Surface Characterisation and Modification of YBCO Thin Films by STM.- Quantitative Near-Surface Microanalysis and Depth Profiling by EPMA.- EPMA Sputter Depth Profiling, Part I: Theory and Evaluation.- EPMA Sputter Depth Profiling, Part II: Experiment.- Quantitative Analysis of BN (C, O, Ar, H)-Coatings Using EPMA and SIMS.- Quantitative EDS Analysis of SiO2/Al2O3/TiO2 Multilayer Films.- Surface Ionization of Thin Films on Substrates: Measurement and Simulation.- Comparison of Different Methods to Characterize Thin a-Si:H Films.- EPMA Studies of the Growth of Thin Surface Coatings Produced by Evaporation.- Analysis of Thin Films with Slightly Rough Boundaries.- Effect of Chromium Substrate Pretreatment on Diamond Growth by the Chemical Vapour Deposition Method.- EPMA Determination of Arsenic Excess in Low Temperature Grown GaAs.- EPMA of Melted UO2 Fuel Rods from the Phebus-FP Reactor Accident Experiment.- Steels, Carbon Concentration, and Microhardness.- Determination of Chemical and Phase Composition of Fly-Ashes by Combined EPMA and XRD Methods.- EPMA of the Composition of Opal-Based Nanostructured Materials.- NDIC and EMP Study of Plagioclase Mineral Zoning: An Example from Nea Kameni Lavas.- Compositional X-Ray Maps of Metamorphic and Magmatic Minerals.- Chemical Mapping of Weathering Stages in Laterites.- Electron Microprobe Determination of Minor and Trace Concentrations of Gold and Platinum Group Elements in Sulphides and Sulpharsenides: Problems, Solutions, and Applications.- Composition of 15-17th Century Archaeological Glass Vessels Excavated in Antwerp, Belgium.- Potassium Migration in Silica Glass During Electron Beam Irradiation.- X-Ray Microanalysis of Frozen-Hydrated Biological Bulk Samples.- Environmental SEM and X-Ray Microanalysis of Biological Materials.- Effects of Electron-Beam/Gas Interactions on X-Ray Microanalysis in the Variable Pressure SEM.- The Analytical Signal in EPMA and the Influence of the Electric Field Created by the Primary Beam.- Standardless Analysis.- A New Technique for Standardless Analysis by EPMA-TWIX.- Stopping Power Factor for Standardless QEPMA.- On the Measurement of the Backscattering Coefficient for Low Energy Electrons.- Monte Carlo Simulations of Edge Artefacts in MULSAM Images.- Assessment of the Inelastic Scattering Model in Monte-Carlo Simulations.- A Rapid Comparison of Matrix Corrections in AES and XPS by Means of Computer Programs.- Fractals and BaTiO3-Ceramic Microstructure Analysis.- Fragmentation of Sputtered Cluster Ions of Transition Metals:Distributions of Lifetimes and Internal Energies.- Sputtering of Tantalum by Atomic and Molecular Gold Ions: Comparative Study of Yields and Kinetic Energy Distributions of Atomic and Cluster Ions.- The Standards, Measurements and Testing Programme (SMT), the European Support to Standardisation, Measurements and Testing Projects.