Electron and Ion Microscopy and Microanalysis

Principles and Applications, Second Edition,

Buch | Softcover

856 Seiten

2019 | 2nd edition
CRC Press (Verlag)
978-0-367-40294-5 (ISBN)

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The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

Lawrence E. Murr

CHAPTER 1: FUNDAMENTAL PROPERTIES OF ELECTRONS AND IONS. CHAPTER 2: ELECTRON EMISSION AND EMISSION AND IONIZATION MICROSCOPY. CHAPTER. 3: ELECTRON AND ION OPTICS AND OPTICAL SYSTEMS. CHAPTER 4: ELECTRON AND ION PROBE MICROANALYSIS. CHAPTER 5: ELECTRON AND ION MICROSCOPY OF SURFACES. CHAPTER 6: ELECTRON DIFFRACTION. CHAPTER 7: TRANSMISSION ELECTRON MICROSCOPY. CHAPTER 8: HIGH-VOLTAGE ELECTRON MICROSCOPY.

Erscheinungsdatum	21.11.2019
Verlagsort	London
Sprache	englisch
Maße	178 x 254 mm
Gewicht	1578 g
Themenwelt	Naturwissenschaften ► Biologie
Themenwelt	Naturwissenschaften ► Physik / Astronomie ► Optik
ISBN-10	0-367-40294-7 / 0367402947
ISBN-13	978-0-367-40294-5 / 9780367402945
Zustand	Neuware