Atom-Probe Tomography
The Local Electrode Atom Probe
Seiten
2016
|
Softcover reprint of the original 1st ed. 2014
Springer-Verlag New York Inc.
978-1-4899-7790-8 (ISBN)
Springer-Verlag New York Inc.
978-1-4899-7790-8 (ISBN)
Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography.
Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy.
Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography.
Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe – a new state-of-the-art instrument – is also provided, along with detailed descriptions and limitations of laser pulsing as a method to field evaporate atoms. Valuable coverage of the new ionization theory is also included, which underpins the overall technique.
Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy.
Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography.
Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe – a new state-of-the-art instrument – is also provided, along with detailed descriptions and limitations of laser pulsing as a method to field evaporate atoms. Valuable coverage of the new ionization theory is also included, which underpins the overall technique.
Introduction to Atom Probe Tomography.- Introduction to the Physics of Field Ion Emitters.- Field Evaporation and Related Topics.- The Art of Specimen Preparation.- The Local Electrode Atom Probe.- Data Reconstruction.- Data Analysis.- Appendices.
| Erscheinungsdatum | 11.10.2016 |
|---|---|
| Zusatzinfo | 62 Illustrations, color; 120 Illustrations, black and white; XVIII, 423 p. 182 illus., 62 illus. in color. |
| Verlagsort | New York |
| Sprache | englisch |
| Maße | 155 x 235 mm |
| Themenwelt | Naturwissenschaften ► Chemie ► Analytische Chemie |
| Naturwissenschaften ► Physik / Astronomie ► Festkörperphysik | |
| Technik ► Maschinenbau | |
| Schlagworte | Atom probe tomography • Decomposition • electropolishing • FIB-based methods • Field Emission • Field Ionization • laser pulsing methods • Metallurgy • microanalysis • Microscopy • Microstructural Characterization • Phase separation • semiconductors |
| ISBN-10 | 1-4899-7790-2 / 1489977902 |
| ISBN-13 | 978-1-4899-7790-8 / 9781489977908 |
| Zustand | Neuware |
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