Probability on Compact Lie Groups
Springer International Publishing (Verlag)
978-3-319-07841-0 (ISBN)
The book is primarily aimed at researchers working in probability, stochastic analysis and harmonic analysis on groups. It will also be of interest to mathematicians working in Lie theory and physicists, statisticians and engineers who are working on related applications. A background in first year graduate level measure theoretic probability and functional analysis is essential; a background in Lie groups and representation theory is certainly helpful but the first two chapters also offer orientation in these subjects.
David Applebaum is Professor of Mathematics at the University of Sheffield, UK. He was educated at St Andrews and Nottingham Universities and has previously worked at Nottingham Trent University, UK. He is the author of over 70 published research papers and 3 books and is currently an associate editor for 3 journals. Most of his research is in the area of probability and stochastic analysis with an emphasis on stochastic processes with jumps (Levy processes), stochastic differential and partial differential equations and processes taking value in Lie groups and manifolds. He has also worked on quantum stochastic processes.
Introduction.- 1.Lie Groups.- 2.Representations, Peter-Weyl Theory and Weights.- 3.Analysis on Compact Lie Groups.- 4.Probability Measures on Compact Lie Groups.- 5.Convolution Semigroups of Measures.- 6.Deconvolution Density Estimation.- Appendices.- Index.- Bibliography.
Erscheint lt. Verlag | 9.7.2014 |
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Reihe/Serie | Probability Theory and Stochastic Modelling |
Vorwort | Herbert Heyer |
Zusatzinfo | XXVI, 217 p. |
Verlagsort | Cham |
Sprache | englisch |
Maße | 155 x 235 mm |
Gewicht | 532 g |
Themenwelt | Mathematik / Informatik ► Mathematik ► Wahrscheinlichkeit / Kombinatorik |
Schlagworte | 60B15, 43A05, 43A77, 43A30 • Fourier transform • Lie groups • Probability • Representation |
ISBN-10 | 3-319-07841-0 / 3319078410 |
ISBN-13 | 978-3-319-07841-0 / 9783319078410 |
Zustand | Neuware |
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